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1

Transmission electron microscopy study of the formation of a contamination layer on the surface of porous silicon

J. Katcki, M. Bugajski

Journal:

Journal of Materials Science: Materials in Electronics

Année:

1994

Langue:

english

Fichier:

PDF, 883 KB

english, 1994

2

Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methods

M. PŁUSKA, A. CZERWINSKI, J. RATAJCZAK, J. KĄTCKI, R. RAK

Journal:

Journal of Microscopy

Année:

2006

Langue:

english

Fichier:

PDF, 143 KB

english, 2006

3

Electrical characterization of shallow cobalt-silicided junctions

E. Simoen, A. Poyai, C. Claeys, N. Lukyanchikova, M. Petrichuk, N. Garbar, A. Czerwinski, J. Katcki, J. Ratajczak, E. Gaubas

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2001

Langue:

english

Fichier:

PDF, 306 KB

english, 2001

4

Formation of Dislocations in InGaAs/GaAs Heterostructures

J. Katcki, J. Ratajczak, J. Adamczewska, F. Phillipp, N. Y. Jin-Phillipp, K. Regiński, M. Bugajski

Journal:

physica status solidi (a)

Année:

1999

Langue:

english

Fichier:

PDF, 316 KB

english, 1999

5

Structure of Oxygen - Implanted Silicon Single Crystals Treated at ≥1400 K under High Argon Pressure

A. Misiuk, A. Barcz, J. Ratajczak, J. Katcki, J. Bak-Misiuk, L. Bryja, B. Surma, G. Gawlik

Journal:

Crystal Research and Technology

Année:

2001

Langue:

english

Fichier:

PDF, 636 KB

english, 2001

6

Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM)

Mariusz Płuska, Andrzej Czerwinski, Jacek Ratajczak, Jerzy Kątcki, Łukasz Oskwarek, Remigiusz Rak

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 307 KB

english, 2009

7

Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method

M. Wzorek, A. Czerwinski, J. Ratajczak, R. Dylewicz, J. Kątcki

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 580 KB

english, 2009

8

TEM study of PtSi contact layers for low Schottky barrier MOSFETs

A. Łaszcz, J. Kątcki, J. Ratajczak, A. Czerwinski, N. Breil, G. Larrieu, E. Dubois

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2006

Langue:

english

Fichier:

PDF, 379 KB

english, 2006

9

Nanostructure formation by high temperature–pressure treatment of silicon implanted with hydrogen/helium

A. Misiuk, B. Surma, J. Ratajczak, J. Kątcki, M. Wzorek, A. Barcz, A. Wnuk, J. Jagielski

Journal:

Superlattices and Microstructures

Année:

2004

Langue:

english

Fichier:

PDF, 969 KB

english, 2004

10

LPE growth and characterisation of GaInAsSb and GaAlAsSb quaternary layers on (100) GaSb substrates

M Piskorski, A Piotrowska, T.T Piotrowski, K Golaszewska, E Papis, J Katcki, J Ratajczak, A Barcz, A Wawro

Journal:

Thin Solid Films

Année:

2004

Langue:

english

Fichier:

PDF, 884 KB

english, 2004

11

Application of ion implantation for mono-Si piezoresistors manufacturing in silicon MEMS technology

B. Jaroszewicz, K. Domanski, D. Tomaszewski, P. Janus, A. Kudla, B. Latecki, A. Kociubinski, M. Nikodem, J. Katcki, M. Wzorek, J. Marczewski, P. Grabiec

Journal:

Année:

2005

Langue:

english

Fichier:

PDF, 265 KB

english, 2005

12

Hydrostatic pressure effect on dislocation evolution in self-implanted Si investigated by electron microscopy methods

M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, J. Kątcki

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 323 KB

english, 2007

13

Very low Schottky barrier to n-type silicon with PtEr-stack silicide

Xiaohui Tang, J. Katcki, E. Dubois, N. Reckinger, J. Ratajczak, G. Larrieu, P. Loumaye, O. Nisole, V. Bayot

Journal:

Solid-State Electronics

Année:

2003

Langue:

english

Fichier:

PDF, 183 KB

english, 2003

14

Sulfide treatment of GaSb surface: influence on the LPE growth of InGaAsSb/AlGaAsSb heterostructures

E Papis, A Piotrowska, E Kamińska, K Gołaszewska, W Jung, J Kątcki, A Kudła, M Piskorski, T.T Piotrowski, J Adamczewska

Journal:

Année:

2000

Langue:

english

Fichier:

PDF, 256 KB

english, 2000

15

On the influence of point defects in the LOCOS process

J. Katcki, R. Gleichmann, J. Łysko, H. Bartsch

Journal:

physica status solidi (a)

Année:

1987

Langue:

english

Fichier:

PDF, 656 KB

english, 1987

16

Defect structure in self-implanted silicon annealed under enhanced hydrostatic pressure – electron microscopy study

M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, B. Surma, J. Kątcki

Journal:

physica status solidi (c)

Année:

2007

Langue:

english

Fichier:

PDF, 305 KB

english, 2007

17

Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure

A. Łaszcz, J. Ratajczak, A. Czerwinski, J. Kątcki, V. Srot, F. Phillipp, P.A. van Aken, N. Breil, G. Larrieu, E. Dubois

Journal:

Materials Science and Engineering: B

Année:

2008

Langue:

english

Fichier:

PDF, 840 KB

english, 2008

18

Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrate

A. ŁASZCZ, J. KĄTCKI, J. RATAJCZAK, XIAOHUI TANG, E. DUBOIS

Journal:

Journal of Microscopy

Année:

2006

Langue:

english

Fichier:

PDF, 129 KB

english, 2006

19

In situ electron beam induced current measurements of the local thickness in semiconductor devices

A. CZERWINSKI, M. PŁUSKA, J. RATAJCZAK, J. KATCKI

Journal:

Journal of Microscopy

Année:

2006

Langue:

english

Fichier:

PDF, 135 KB

english, 2006

20

Buried amorphous-layer impact on dislocation densities in silicon

M. WZOREK, J. KĄTCKI, M. PŁUSKA, J. RATAJCZAK, B. JAROSZEWICZ, K. DOMAŃSKI, P. GRABIEC

Journal:

Journal of Microscopy

Année:

2006

Langue:

english

Fichier:

PDF, 132 KB

english, 2006

21

Editorial

J. KĄTCKI, A. CZERWINSKI

Journal:

Journal of Microscopy

Année:

2006

Langue:

english

Fichier:

PDF, 34 KB

english, 2006

22

Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging

M. PLUSKA, A. CZERWINSKI, J. RATAJCZAK, J. KĄTCKI, Ł. OSKWAREK, R. RAK

Journal:

Journal of Microscopy

Année:

2010

Langue:

english

Fichier:

PDF, 187 KB

english, 2010

23

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. RATAJCZAK, A. ŁASZCZ, A. CZERWINSKI, J. KĄTCKI, F. PHILLIPP, P.A. VAN AKEN, N. RECKINGER, E. DUBOIS

Journal:

Journal of Microscopy

Année:

2010

Langue:

english

Fichier:

PDF, 372 KB

english, 2010

24

Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance

A. CZERWINSKI, M. PLUSKA, J. RATAJCZAK, A. SZERLING, J. KąTCKI

Journal:

Journal of Microscopy

Année:

2010

Langue:

english

Fichier:

PDF, 176 KB

english, 2010

25

Depth measurements of etch-pits in GaN with shape reconstruction from SEM images

M. WZOREK, A. CZERWINSKI, J. RATAJCZAK, A. LUI, E. IACOB, J. KĄTCKI

Journal:

Journal of Microscopy

Année:

2010

Langue:

english

Fichier:

PDF, 267 KB

english, 2010

26

Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers

A. ŁASZCZ, A. CZERWINSKI, J. RATAJCZAK, A. SZERLING, F. PHILLIPP, P.A. VAN AKEN, J. KĄTCKI

Journal:

Journal of Microscopy

Année:

2010

Langue:

english

Fichier:

PDF, 354 KB

english, 2010

27

New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

M. PŁUSKA, A. CZERWINSKI, J. RATAJCZAK, J. KĄTCKI, L. MARONA, R. CZERNECKI, M. LESZCZYŃSKI, P. PERLIN

Journal:

Journal of Microscopy

Année:

2009

Langue:

english

Fichier:

PDF, 268 KB

english, 2009

28

Introduction: Themed issue – Papers Arising from 7th Polish–Japanese Joint Seminar on Micro and Nano Analysis

Journal:

Journal of Microscopy

Année:

2009

Langue:

english

Fichier:

PDF, 28 KB

english, 2009

29

TEM studies of PtSi low Schottky-barrier contacts for source/drain in MOS transistors

Adam Łaszcz, Jacek Ratajczak, Andrzej Czerwinski, Jerzy Kątcki, Nicolas Breil, Guilhem Larrieu, Emmanuel Dubois

Journal:

Central European Journal of Physics

Année:

2011

Langue:

english

Fichier:

PDF, 1.97 MB

english, 2011

30

Defect detection in semiconductor layers with built-in electric field with the use of cathodoluminescence

Mariusz Pluska, Andrzej Czerwinski, Jacek Ratajczak, Anna Szerling, Jerzy Kątcki

Journal:

Physica B: Condensed Matter

Année:

2012

Langue:

english

Fichier:

PDF, 550 KB

english, 2012

31

Effect of uniform stress on silicon implanted with helium, hydrogen and oxygen

A Misiuk, J Bak-Misiuk, I.V Antonova, V Raineri, A Romano-Rodriguez, A Bachrouri, H.B Surma, J Ratajczak, J Katcki, J Adamczewska, E.P Neustroev

Journal:

Computational Materials Science

Année:

2001

Langue:

english

Fichier:

PDF, 556 KB

english, 2001

32

Tuning InAs/GaAs quantum dot properties under Stranski-Krastanov growth mode for 1.3 Î¼m applications

Chen, J. X., Markus, A., Fiore, A., Oesterle, U., Stanley, R. P., Carlin, J. F., HoudreÌ, R., Ilegems, M., Lazzarini, L., Nasi, L., Todaro, M. T., Piscopiello, E., Cingolani, R., Catalano, M., Katcki

Journal:

Journal of Applied Physics

Année:

2002

Langue:

english

Fichier:

PDF, 741 KB

english, 2002

33

Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy

Wzorek, Marek, Czerwiński, Andrzej, Kuchuk, Andrian V., Ratajczak, Jacek, Piotrowska, Anna, Kątcki, Jerzy

Journal:

Solid State Phenomena

Année:

2012

Langue:

english

Fichier:

PDF, 988 KB

english, 2012

34

Formation of platinum-based silicide contacts: Kinetics, stoichiometry, and current drive capabilities

Larrieu, G., Dubois, E., Wallart, X., Baie, X., Katcki, J.

Journal:

Journal of Applied Physics

Année:

2003

Langue:

english

Fichier:

PDF, 1.19 MB

english, 2003

35

[IEEE 2006 International Radar Symposium - Krakow, Poland (2006.05.24-2006.05.26)] 2006 International Radar Symposium - Polish Automated System for Air Forces - Polish Way to Introduce Network Enabled Capability

Katcki, Andrzej

Année:

2006

Langue:

english

Fichier:

PDF, 4.80 MB

english, 2006

36

[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Iridium Silicide: a Promising Electrode for Metallic Source/Drain in Decananometer MOSFETs

Larrieu, Guilhem, Dubois, Emmanuel, Wallart, Xavier, Katcki, Jerzy

Année:

2006

Langue:

english

Fichier:

PDF, 248 KB

english, 2006

37

Observation of radiation defects generated in edge defined film fed growth silicon ribbons under 400 kV irradiation in the high-resolution electron microscope

Katcki, Jerzy, Ast, Dieter

Journal:

Journal of Applied Physics

Année:

1988

Langue:

english

Fichier:

PDF, 1.22 MB

english, 1988

38

Accurate extraction of the diffusion current in silicon p-n junction diodes

E. Simoen, C. Claeys, A. Czerwinski, J. Katcki

Année:

1998

Langue:

english

Fichier:

PDF, 329 KB

english, 1998

39

Kinetics, stoichiometry, morphology, and current drive capabilities of Ir-based silicides

Larrieu, G., Dubois, E., Wallart, X., Katcki, J.

Journal:

Journal of Applied Physics

Année:

2007

Langue:

english

Fichier:

PDF, 795 KB

english, 2007

40

Electrically injected InGaAs/GaAs quantum-dot microcavity light-emitting diode operating at 1.3 μm and grown by metalorganic chemical vapor deposition

Tasco, V., Todaro, M. T., De Vittorio, M., De Giorgi, M., Cingolani, R., Passaseo, A., Ratajczak, J., Katcki, J. W.

Journal:

Applied Physics Letters

Année:

2004

Langue:

english

Fichier:

PDF, 304 KB

english, 2004

41

Electrical and Transmission Electron Microscopy Characterisation of 4H-SiC Homoepitaxial Mesa Diodes

Czerwinski, A., Ratajczak, Jacek, Katcki, J., Bakowski, A., Bakowski, Mietek

Journal:

Materials Science Forum

Année:

1998

Fichier:

PDF, 446 KB

1998

42

Identification and reduction of acoustic-noise influence on focused ion beam (FIB)

Pluska, M., Czerwinski, A., Wzorek, M., Juchniewicz, M., Kątcki, J.

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Année:

2015

Langue:

english

Fichier:

PDF, 1.20 MB

english, 2015

43

Study of Oxides Formed in HfO2/Si Structure for High-k Dielectric Applications

Łaszcz, Adam, Czerwiński, Andrzej, Ratajczak, Jacek, Taube, Andrzej, Gierałtowska, Sylwia, Piotrowska, Anna, Kątcki, Jerzy

Journal:

Solid State Phenomena

Année:

2012

Langue:

english

Fichier:

PDF, 3.01 MB

english, 2012

44

Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM

Płuska, Mariusz, Czerwiński, Andrzej, Ratajczak, Jacek, Szerling, Anna, Kątcki, Jerzy

Journal:

Solid State Phenomena

Année:

2012

Langue:

english

Fichier:

PDF, 500 KB

english, 2012

45

Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS

Wzorek, Marek, Czerwiński, Andrzej, Ratajczak, Jacek, Borysiewicz, Michał A., Kuchuk, Andrian V., Piotrowska, Anna, Kątcki, Jerzy

Journal:

Materials Science Forum

Année:

2014

Langue:

english

Fichier:

PDF, 480 KB

english, 2014

46

Fabrication of GaSb Microlenses by Photo and E-Beam Lithography and Dry Etching

Papis, E., Piotrowska, Anna, Piotrowski, T.T., Gołaszewska, K., Ilka, L., Kruszka, R., Ratajczak, Jacek, Kątcki, J., Wróbel, J., Aleszkiewicz, M., Łukaskiewicz, R.

Journal:

Solid State Phenomena

Année:

2004

Langue:

english

Fichier:

PDF, 812 KB

english, 2004

47

Amorphous Ni–Zr layer applied for microstructure improvement of Ni-based ohmic contacts to SiC

Wzorek, M., Czerwinski, A., Borysiewicz, M.A., Gołaszewska, K., Myśliwiec, M., Ratajczak, J., Piotrowska, A., Kątcki, J.

Journal:

Materials Science and Engineering: B

Année:

2015

Langue:

english

Fichier:

PDF, 2.63 MB

english, 2015

48

Fabrication of Electrochemical Nanoelectrode for Sensor Application Using Focused Ion Beam Technology

Łaszcz, Adam, Nogala, Wojciech, Czerwinski, Andrzej, Ratajczak, Jacek, Kątcki, Jerzy

Journal:

Polish Journal of Chemical Technology

Année:

2014

Langue:

english

Fichier:

PDF, 304 KB

english, 2014

49

SPIE Proceedings [SPIE International Conference on Solid State Crystals 2000 - Zakopane, Poland (Monday 9 October 2000)] International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology - Technology and properties of GaAlAsSb layers grown on GaSb substrates

Piskorski, M., Papis-Polakowska, Ewa, Piotrowski, Tadeusz T., Golaszewska, K., Katcki, J., Ratajczak, J., Adamczewska, J., Barcz, A., Zielinski, M., Piotrowska, Anna, Rutkowski, Jaroslaw, Wenus, Jakub

Année:

2001

Langue:

english

Fichier:

PDF, 1.54 MB

english, 2001

50

The effect of Ni:Si ratio on microstructural properties of Ni/Si ohmic contacts to SiC

Wzorek, M., Borysiewicz, M.A., Czerwinski, A., Myśliwiec, M., Ekielski, M., Ratajczak, J., Piotrowska, A., Kątcki, J.

Journal:

Applied Surface Science

Année:

2016

Langue:

english

Fichier:

PDF, 693 KB

english, 2016